VC++晶片内部缺陷处理+文献综述
时间:2017-02-16 17:02 来源:毕业论文 作者:毕业论文 点击:次
| 摘要当今社会中，人们的生活丰富多彩，形形色色的电子产品已变为不可或缺的生活用品。而这些电子产品都不能脱离晶片。晶片被广泛应用于电子数码类产品的开发以及应用，是一种稳定性好，使用方便，并且价格低廉的基础元件。但是晶片的制作材料使得它在运输或操作过程中极易发生断裂和破损，尤其是当出现一些微小缺陷时，极大地限制了它的使用范围，提高了使用成本。本次课题则是突破了传统检测晶片的方法，使用数字图像处理技术来进行晶片内部缺陷的检测，从而实现更高的精度和更快的速度，有效的节省了检测时间和检验成本。这种高效、价格低廉的检测方式一直是海内外技术人员不断努力的目标。5948 本毕业论文首先介绍数字图像处理技术相对于传统检测方法的优势，接下来着重介绍和讲解了在缺陷检测过程中所用到的算法和理论。噪声处理，边缘检测，自动阈值算法，二值化，以及最终污点检测的递归算法，都是本文主要叙述的内容。图像处理的过程是在Visual C++ 2008环境下编程实现的。 关键词 晶片缺陷 图像处理 特征提取 预处理 毕业设计说明书（论文）外文摘要 Title Internal Defect Detection for Chips Images Abstract In modern society, people's life is colorful and persified, all kinds of electronic products has become an indispensable daily necessities. At the meantime, these electronic products cannot be made without chips. The chips, which are widely used in the development and application of electronic digital products, are regarded as basic components with a good stability, simplicity and inexpensive price. But the material of chip makes it vulnerable to fracture and break in transportation or operation, especially when there are some tiny defects, which greatly limits the area and the expense. This topic step over the traditional methods of chip detection, using digital image processing technology to the chip internal defect detection in order to achieve higher accuracy and faster speed, effectively saving the detecting time and cost of tests. This efficient and inexpensive detecting method has been the goal of the technical personnel at home and abroad. Firstly, in this thesis rises introduction to the advantages of digital image processing technology comparing to traditional methods. In the following part, it highlights and explain the algorithms and theory used in the process of defect detection. The content of this thesis contains, for instance, noise processing, edge detection, automatic threshold algorithm, binarization, and, ultimately, the recursive algorithm of the stain detection. The image processing program is finished in Visual C + + 2008 environment. Keywords Chip defect, Image processing, Feature extraction, Pretreatment 目 次 1 绪论 1 1．1 传统晶片检测技术综述 1 1．2 数字图像处理技术简介 2 1．3 数字图像处理内容 2 1．4 数字图像处理的发展及其应用 4 1．5 本文主要工作介绍 5 2 基于Visual C++ 2008 的编程框架 5 2.1 编程框架的作用 5 2.2 编程框架的构建和经典的图像处理流程 5 2.3 编程框架的优势 6 2.4 编程框架中的具体类实现 6 3 晶片图像的预处理 7 3.1 24位真彩色位图转为8位灰度图 7 3.2 图像的平滑滤波 8 (责任编辑：qin) |