FPGA故障检测仪信号产生与检测电路设计
毕业论文 关键词 故障检测 信号产生 EP3C25 AT91SAM9G20
Title Design of Signal Generation and Detection Circuit for Fault Detector
Abstract With the application of artificial intelligence and computer technology in the field of fault detection ,the fault detection of all countries has obtained very significant achievement both in theory and in practice .For the fault detection of certain electronic equipment, the project completes the design and debugging of signal generation and detection circuit in the detector which can detect a variety of circuit board faults. Firstly, the overall design scheme of detector is introduced ,and the functional requirements and performance indicators of signal generation and detection circuit is refined .Then , based on ARM chip AT91SAM9G20 of ATMEL company and FPGA chip EP3C25 of ALTERA company , the design of signal generation and detection circuit is given, and the devising of the wiring hardware circuit schematic and PCB board is completed. After the processing and assembling of signal generation and detection circuit, the test plan is provided ,and the results of the system debugging for hardware circuit show that this design can meet the requirements .
Keywords fault detection signal generation EP3C25 AT91SAM9G20
目次
1绪论1
1.1选题背景...1
1.2研究现状...1
1.3本文主要内容...2
2故障检测仪的总体设计3
2.1系统要求3
2.2故障检测仪组成框图..3
2.3电路设计软件简介7
3故障检测仪信号产生与检测电路的设计.10
3.1信号产生与检测电路的组成...10
3.2主处理芯片介绍.14
3.3ARM系统电路设计...15
3.4FPGA系统电路设计..27
3.5DAC电路...29
3.6IIC总线电路...31
3.7PCB设计...33
4系统测试...35
4.1测试方案...35
4.2测试过程...37
4.3测试结果...39
结论40
致谢41
参考文献...42
1 绪论 1.1 选题背景 测试技术和仪器是科学研究中获取、处理和显示信息的重要手段。随着科学技术的快速发展，特别是数字技术及各种超大规模集成电路的广泛应用，电子装备尤其是军用电子设备结构越来越复杂，功能越来越完善，自动化程度也越来越高。虽然电子系统的性能得到提高，但是对测试和维修保障也带来了测试流程复杂、测试时间长、维修保障困难、维修费用高等诸多问题，这些问题严重影响了电子设备的完好性和寿命周期，因此系统的测试开销急剧增加。 电子设备是由各种元器件构成的，由于制造工艺的限制、使用寿命及工作条件的影响，故障的产生式不可避免的。为了保证系统的可靠运行，故障检测必不可少。 所谓故障检测就是确定待检测电路是否存在故障，若存在故障，则通过一定的手段来进行故障的定位[1]。根据电路的类型可将故障检测分为两类：模拟系统的故障检测和数字系统的故障检测。模拟系统由于自身的特点，使得其故障检测比数字系统更复杂。模拟信号量是连续的，任何一个元件的参数超过其容差时就属故障，因此模拟电路的故障状态是无限的。数字系统故障检测的基本思想是在输入端加载激励信号，在输出端得到响应，根据激励和响应的组合关系以及电路的拓扑关系确定故障点[2]。其关键是检测向量的生成，即在输入端加载什么样的激励信号，才能使电路内部的故障点反应出来。