摘要:宽带隙半导体碳化硅(SiC)在大功率电力电子器件中具有重要应用。为了更好了解氧气在SiC表面的吸附特性,本文采用第一性原理方法,选取SiC(100)面以及SiC(111)面,研究了氧在表面不同位置的吸附情况。结果表明,氧原子吸附情况下,(100)面桥位的吸附能最大,而(111)面的空位吸附更加稳定;对于氧气分子吸附的情形,(100)面依然是桥位的吸附能最大,而(111)面顶位的吸附更稳定,当氧覆盖率增大时,两个面吸附氧气的吸附能差距减小。所得结果为进一步研究氧吸附对SiC物性的影响提供了基础。91411
毕业论文关键词:碳化硅,氧,表面吸附,第一性原理
Abstract:Silicon carbide (SiC) as a wide band gap semiconductor has been a preferred "successor" of silicon semiconductor material due to its high thermal conductivity, high electron saturation velocity, and large critical breakdown field。 In this thesis, we study the adsorption effects of oxygen on SiC (100) and SiC (111) surfaces by first-principles calculations。 For the adsorption of oxygen atom, the bridge site of the SiC (100) surface is the most stable, while the adsorption energy of the vacancy site of the (111) surface is the largest。 In the case of oxygen
molecules, the adsorption capacity of the bridge site of the SiC (100) surface is the largest and the adsorption structure is more stable, while the adsorption capacity of the top sites of the SiC
(111) surface is greater and the adsorption configuration is the most stable。 Our results provide the basis for further investigation of the effects of oxygen adsorption on the properties of the SiC (100) and SiC (111) surfaces。
Keyword: silicon carbide, oxygen, surface adsorption, first-principles calculation
目录
1绪论 4
1。1研究背景 4
1。2SiC材料的物理特性源G于J优L尔V论N文M网WwW.youeRw.com 原文+QQ75201`8766 及应用 4
1。3论文主要内容 5
2理论基础和计算方法 6
2。1第一性原理 6
2。1。1Hartree-Fock方法 6
2。1。2密度泛函理论 7
2。1。3Hohenberg-Kohn定理 7
2。1。4交换关联势 8
2。2计算方法 9
3氧原子在SiC表面的吸附 9
3。1SiC(100)面的吸附 9
3。1。1SiC(100)面模型结构 9
3。1。2氧原子在sic(100)面的吸附 10
3。2SiC(111)面的吸附 11
3。2。1SiC(111)面模型结构 11
3。2。2氧原子在SiC(111)面的吸附 12
3。3氧原子在不同面的吸附 13
4氧气在SiC表面的吸附 14
4。1氧气在sic(100)面的吸附 14
4。2氧气在SiC(111)面的吸附 16
4。3氧气在不同面的吸附 17
5结果分析 18
结论 20
参考文献 21
致谢 SiC表面氧气吸附的第一性原理研究:http://www.youerw.com/wuli/lunwen_198894.html